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Correlative workflow to identify the root cause of particle contamination
Suppliers, manufacturers and end users demand ever-increasing quality standards, so an advanced technical cleanliness program is fundamental to eradicating critical particulate contamination along the entire production process. ZEISS Technical Cleanliness Solutions identify the root cause of contamination, allowing you to make the right decision faster.
Particularly clean
Quality assured
Particulate contamination is the enemy of any product’s efficiency, functionality and longevity. Investigations have shown that the major source of failure in hydraulic and oil-filled machines is based on particulate contamination. Oil analysis helps to minimize maintenance costs and improve machine uptime. To achieve maximum quality, manufacturers need clear and comprehensive particle analysis data.
ZEISS Technical Cleanliness Solutions identify the root cause of contamination, allowing you to make the right decision faster.
Tailored precisely
to the needs of manufacturing industries
ZEISS Technical Cleanliness Solutions were developed in collaboration with automotive companies. They had a specific need for powerful particle identification and classification systems, which had to be simple to use.
As a result, ZEISS solutions are easy to apply, can be deployed to multiple sites within any manufacturing or industrial environment and used by operators who are not microscopy experts.
ZEISS particle analysis solutions comply with industry standards:
Technical cleanliness |
Oil cleanliness |
Cleanliness of |
VDA 19.1 |
ISO 4406 |
VDI 2083 |
ISO 16232 |
ISO 4007 |
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DIN 51455 |
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SAE AS 4059 |
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Go beyond standards
Make informed decisions about the root cause of contamination
The ZEISS solution portfolio enables combined particle detection and classification in a highly efficient workflow that not only finds particles, but also helps to classify them by contamination or wear origin.
With ZEISS you can combine data from both light and electron microscopes in a single workflow to get more comprehensive information.

Estimate potential risk for contamination
Light microscopy systems
Itemize particles by quantity, size distribution and morphology, and distinguish metallic from non-metallic particles and fibers down to 2 μm. Create cleanliness reports according to industry standards.
Establish advanced analysis workflow
Correlative particle analysis
Characterize process-critical particles and identify killer particles using Correlative Automated Particle Analysis (CAPA), which combines your data from both light and electron microscopes in a single workflow.
Pinpoint sources of contamination
Electron microscopy and EDS systems
Measure morphological characteristics of particles and use fully automated elemental analyses to classify particles by their chemical composition.
Get in contact with our experts for Technical Cleanliness
Please fill out the form to reach out to us. Feel free to request a meeting or demo of our product.