ZEISS EVO Webinar Rely on the ZEISS EVO microscope as the most qualified SEM for Materials Science applications

Rely on the ZEISS EVO" conventional SEM as the most qualified SEM for materials science applications. It is easy and intuitive to use.

Designed specifically for routine inspection and analysis applications, ZEISS EVO excels at offering an operational concept that appeals not only to experienced microscopists, but also to technicians who are not SEM experts. It delivers best-in-class, high quality data, especially for non-conductive parts that cannot be coated with a conductive layer due to a requirement for subsequent reviews.

A truly unique attribute of EVO is its seamless integration into a multi-modal workflow including light microscopes and varied analytical techniques across systems, labs or even different locations.

Value Beyond Routine SEM Applications: Correlative Particle Analysis

SmartPI on the EVO, working together with ZEISS light microscopy particle analyzers, enable a correlative workflow, whereby the light microscopes detect particle size, differentiate shape, and classify metallic particles, before EVO takes over to measure the elemental composition of the metallic particles. This highly efficient workflow not only finds particles, but also classifies particles by size, shape and likely contamination or wear origin. 

> Join us on 6th March at 1:30 et leverage your knowledge on SEM technology with ZEISS EVO.