The VersaXRM family and UltraXRM lab platforms offer a multi-lengthscale solution. State of the art X-ray computed tomography (CT) scanning technology combined with highly specialized, proprietary X-ray optics deliver the highest performance lab-based 3D X-ray microscopes, providing a range of imaging modes from ~30 micron resolution all the way down to 50nm spatial resolution.
The VersaXRM uses patented X-ray detectors and a microscope turret of magnifying objective detectors for easy zooming. Scan mode from 30 micron resolution all the way down to 700 nm spatial resolution. The UltraXRM nanoscale X-ray microscope is the only commercially available X-ray microscope that utilizes synchrotron quality X-ray optics and provides true spatial resolution down to <50nm.
The flagship product of the award-winning VersaXRM family provides the most advanced and highest performing non-destructive, 3D imaging and analysis capabilities. The VersaXRM-520 extends the boundaries of non-destructive 3D imaging with advanced contrast tuning capabilities, extensive filtering options, and enhancements delivering greater accuracy and workflow.
Based on the award-winning design of its predecessor, the VersaXRM-510 is the foundation of the VersaXRM family for those who need the highest 3D imaging capability without the advanced features and performance of the flagship product.
The VersaXRM-410 bridges the gap between high-performing 3D X-ray microscopy solutions and traditionally lower-cost, less capable projection-based computed tomography (CT) systems. Multiple source options provide flexibility for imaging a wide range of sample sizes and types.
The revolutionary UltraXRM-L200 combines a high-flux laboratory X-ray source with highly specialized and proprietary X-ray optics to create a standalone ultra-high resolution X-ray microscope for CT scanning, bridging the gap between existing high resolution imaging modalities such as SEM, TEM or AFM, and optical microscopy or traditional micro-CT.
The MicroXCT-200 is a versatile 3D X-ray imaging system suited for non-destructive analysis of a large variety of samples. Its unique design allows for high resolution imaging for relatively large samples